Vitrek, a US-based manufacturer of high-precision test and measurement equipment, offers the 95X Series hipot tester with 100 pico-amp leakage current resolution for detecting micro-level insulation ...
Abstract: This paper presents an evaluation of the new JEDEC standard JEP173. The JEP173 establishes a characterization procedure to reliably assess the dynamic ON-resistance of GaN lateral power ...
McGill researchers have developed a diagnostic system capable of identifying bacteria—and determining which antibiotics can stop them—in just 36 minutes, a major advance in the global effort to curb ...
When news breaks, you need to understand what actually matters. At Vox, our mission is to help you make sense of the world — and that work has never been more vital. But we can’t do it on our own. We ...
Abstract: Dynamic resistance degradation, which is severely affected by the trapping effect, is a critical challenge for lateral AlGaN/GaN power devices, especially when operating in high-voltage and ...
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