Abstract: The virtual-body p-GaN gate HEMT (VB-HEMT) has been demonstrated as an effective method to suppress buffer trapping induced dynamic R ON degradation. The buffer trapping is fully screened by ...
Abstract: Transistor scaling enabled by gate length scaling requires EOT scaling to less than 1 nm thickness [1]. This work successfully integrates Hf-based ALD higher-k dielectrics with CVD-grown ...
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