Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

Cascade Microtech Inc. today will field a characterization system that it says can shave weeks off the power semiconductor development cycle. The Tesla probe station allows power semiconductors to be ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Keeping an IC cool takes on new meaning when power dissipation exceeds 150 watts. Innovative electrical and mechanical solutions to new wafer testing challenges continue to be developed. For example, ...

SANTA CLARA, Calif.--(BUSINESS WIRE)--What’s New: Intel, Bluefors* and Afore* have introduced the first cryoprober, a quantum testing device named the Cryogenic Wafer Prober, developed specifically to ...

The net result is to move entire tests or critical test sequences to much earlier in the test process, which usually means more wafer-level testing to support KGD quality, collecting more device ...

HSINCHU, July 29, 2022 /PRNewswire/ -- MPI Corporation's Advanced Semiconductor Test Division, an industry and innovation leader of semiconductor test solutions initiated the integration of the TS3500 ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

Hermes Testing Solutions Inc. (HTSI), a provider of semiconductor wafer testing solutions, said demand for flexible and highly customized testing equipment is increasing as advanced process nodes ...